Reach Us +44-7480-724769
All submissions of the EM system will be redirected to Online Manuscript Submission System. Authors are requested to submit articles directly to Online Manuscript Submission System of respective journal.

Abstract

X-Ray Photoelectron Spectroscopy Studies of Metal Chalcogenide Thin Films: A Review

Author(s): Ho Soonmin

X-ray photoelectron spectroscopy (XPS) on sample analysis has the capability to give useful information about the surface layer in thin films. In this work, chemical composition and elemental oxidation states will be studied for binary, ternary and quaternary thin films.


Share this       
izmir escort izmir escort bursa escort antalya escort izmir escort porno porno izle türk porno eskişehir escort bartın escort burdur escort havalandırma izmir escort bursa escort porno indir izle escort izmir