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Abstract

X-Ray Photoelectron Spectroscopy Studies of Metal Chalcogenide Thin Films: A Review

Author(s): Ho Soonmin

X-ray photoelectron spectroscopy (XPS) on sample analysis has the capability to give useful information about the surface layer in thin films. In this work, chemical composition and elemental oxidation states will be studied for binary, ternary and quaternary thin films.


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