Abstract

Synthesis and Characterization of Cadmium Chalcogenide CdX (X = S, Te) Thin Films

Author(s): S. Tewari and A. Bhattacharjee

Thin films of cadmium chalcogenides, CdS and CdTe, on glass substrates were prepared by chemical spray pyrolysis technique. The structural characterization of the films was performed by XRD, which confirmed that the films were of CdS and CdTe, respectively. XRD studies also showed that CdS crystallites were aligned with a preferred orientation along (002) plane whereas CdTe crystallites exhibited a preferred orientation along (111) plane. The optical characterization of these films was carried out using UV/visible spectroscopy. Both CdS and CdTe were found to behave as direct band gap semiconductors in these thin films. From the UV/Vis spectral data, the optical bang gap of both these thin film was determined


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