Abstract

Growth of silver nanoparticles on silica matrix: Study by x-ray photoelectron spectroscopy, x-ray diffraction and TEM

Author(s): Surender Duhan

X-ray diffraction and X-ray photoelectron spectroscopy analyses are performed to investigate silver nanoparticles embedded in an amorphous SiO2 matrix. The different silver contents and reaction temperatures were investigated. silver -silica nanocomposites are prepared by sol–gel method. After the drying, the sol–gel samples are annealed in air environment. Crystalline silver nanoparticles are identified in sol–gel samples (20–50 nmsize).


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